A major semiconductor packaging and test house
Wafer Defect Detection and AOI Review
Detection efficiency up 5×, false-call rate down 70%
Pain Points
Customer pain points
- Many defect types slow manual review
- Smaller process nodes demand more precise checks
- Repetitive review occupies senior engineers
Results
Results and benefits
- AI classifies defects 5× faster
- False calls fell 70%
- On-premises deployment keeps fab data in-house
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